arXiv++ Combinatorics

We classify isomorphism-invariant random digraphs according to where randomness resides, namely, arcs, vertices, and vertices and arcs together which in turn yield arc random digraphs (ARD), vertex random digraphs (VRD) and vertex-arc random digraphs (VARD), respectively. This digraph classification can be viewed as an extension of the classification of isomorphism-invariant random graphs. We introduce randomness in the direction of the edges of a given graph and obtain direction random digraphs (DRD) as well. We classify DRDs according to which component is random in addition to the direction and study the relations of DRDs with VARDs, VRDs and ARDs. We also consider random nearest neighbor digraphs and determine their membership with respect to these digraph families.

We consider the distribution of a graph invariant of central similarity proximity catch digraphs (PCDs) based on one dimensional data. The central similarity PCDs are also a special type of parameterized random digraph family defined with two parameters, a centrality parameter and an expansion parameter, and for one dimensional data, central similarity PCDs can also be viewed as a type of interval catch digraphs. The graph invariant we consider is the relative density of central similarity PCDs. We prove that relative density of central similarity PCDs is a U-statistic and obtain the asymptotic normality under mild regularity conditions using the central limit theory of U-statistics. For one dimensional uniform data, we provide the asymptotic distribution of the relative density of the central similarity PCDs for the entire ranges of centrality and expansion parameters. Consequently, we determine the optimal parameter values at which the rate of convergence (to normality) is fastest. We also provide the connection with class cover catch digraphs and the extension of central similarity PCDs to higher dimensions.

We consider two parametrized random digraph families, namely, proportional-edge and central similarity proximity catch digraphs (PCDs) and compare the performance of these two PCD families in testing spatial point patterns. These PCD families are based on relative positions of data points from two classes and the relative density of the PCDs is used as a statistic for testing segregation and association against complete spatial randomness. When scaled properly, the relative density of a PCD is a U-statistic. We extend the distribution of the relative density of central similarity PCDs for expansion parameter being larger than one. We compare the asymptotic distribution of the statistic for the two PCD families, using the standard central limit theory of U-statistics. We compare finite sample performance of the tests by Monte Carlo simulations and prove the consistency of the tests under the alternatives. The asymptotic performance of the tests under the alternatives is assessed by Pitman's asymptotic efficiency. We find the optimal expansion parameters of the PCDs for testing each of the segregation and association alternatives in finite samples and in the limit. We demonstrate that in terms of empirical power (i.e., for finite samples) relative density of central similarity PCD has better performance (which occurs for expansion parameter values larger than one) under segregation alternative, while relative density of proportional-edge PCD has better performance under association alternative. The methods are illustrated in a real-life example from plant ecology.

We study a new kind of proximity graphs called proportional-edge proximity catch digraphs (PCDs)in a randomized setting. PCDs are a special kind of random catch digraphs that have been developed recently and have applications in statistical pattern classification and spatial point pattern analysis. PCDs are also a special type of intersection digraphs; and for one-dimensional data, the proportional-edge PCD family is also a family of random interval catch digraphs. We present the exact (and asymptotic) distribution of the domination number of this PCD family for uniform (and non-uniform) data in one dimension. We also provide several extensions of this random catch digraph by relaxing the expansion and centrality parameters, thereby determine the parameters for which the asymptotic distribution is non-degenerate. We observe sudden jumps (from degeneracy to non-degeneracy or from a non-degenerate distribution to another) in the asymptotic distribution of the domination number at certain parameter values.

The vertex-random graphs called proximity catch digraphs (PCDs) have been introduced recently and have applications in pattern recognition and spatial pattern analysis. A PCD is a random directed graph (i.e., digraph) which is constructed from data using the relative positions of the points from various classes. Different PCDs result from different definitions of the proximity region associated with each data point. We consider the underlying and reflexivity graphs based on a family of PCDs which is determined by a family of parameterized proximity maps called proportional-edge (PE) proximity map. The graph invariant we investigate is the relative edge density of the underlying and reflexivity graphs. We demonstrate that, properly scaled, relative edge density of these graphs is a $U$-statistic, and hence obtain the asymptotic normality of the relative edge density for data from any distribution that satisfies mild regulatory conditions. By detailed probabilistic and geometric calculations, we compute the explicit form of the asymptotic normal distribution for uniform data on a bounded region in the usual Euclidean plane. We also compare the relative edge densities of the two types of the graphs and the relative arc density of the PE-PCDs. The approach presented here is also valid for data in higher dimensions.

The use of data-random graphs in statistical testing of spatial patterns is introduced recently. In this approach, a random directed graph is constructed from the data using the relative positions of the points from various classes. Different random graphs result from different definitions of the proximity region associated with each data point and different graph statistics can be employed for pattern testing. The approach used in this article is based on underlying graphs of a family of data-random digraphs which is determined by a family of parameterized proximity maps. The relative edge density of the AND- and OR-underlying graphs is used as the summary statistic, providing an alternative to the relative arc density and domination number of the digraph employed previously. Properly scaled, relative edge density of the underlying graphs is a U-statistic, facilitating analytic study of its asymptotic distribution using standard U-statistic central limit theory. The approach is illustrated with an application to the testing of bivariate spatial clustering patterns of segregation and association. Knowledge of the asymptotic distribution allows evaluation of the Pitman asymptotic efficiency, hence selection of the proximity map parameter to optimize efficiency. Asymptotic efficiency and Monte Carlo simulation analysis indicate that the AND-underlying version is better (in terms of power and efficiency) for the segregation alternative, while the OR-underlying version is better for the association alternative. The approach presented here is also valid for data in higher dimensions.

Proximity catch digraphs (PCDs) are based on proximity maps which yield proximity regions and are special types of proximity graphs. PCDs are based on the relative allocation of points from two or more classes in a region of interest and have applications in various fields. In this article, we provide auxiliary tools for and various characterizations of PCDs based on their probabilistic behavior. We consider the cases in which the vertices of the PCDs come from uniform and non-uniform distributions in the region of interest. We also provide some of the newly defined proximity maps as illustrative examples.

Proximity maps and regions are defined based on the relative allocation of points from two or more classes in an area of interest and are used to construct random graphs called proximity catch digraphs (PCDs) which have applications in various fields. The simplest of such maps is the spherical proximity map which maps a point from the class of interest to a disk centered at the same point with radius being the distance to the closest point from the other class in the region. The spherical proximity map gave rise to class cover catch digraph (CCCD) which was applied to pattern classification. Furthermore for uniform data on the real line, the exact and asymptotic distribution of the domination number of CCCDs were analytically available. In this article, we determine some appealing properties of the spherical proximity map in compact intervals on the real line and use these properties as a guideline for defining new proximity maps in higher dimensions. Delaunay triangulation is used to partition the region of interest in higher dimensions. Furthermore, we introduce the auxiliary tools used for the construction of the new proximity maps, as well as some related concepts that will be used in the investigation and comparison of them and the resulting graphs. We characterize the geometry invariance of PCDs for uniform data. We also provide some newly defined proximity maps in higher dimensions as illustrative examples.