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On the index of Simon's congruence for piecewise testability
Prateek Karandikar
,
Manfred Kufleitner
,
Philippe Schnoebelen
Published: 2013-10-03 | Updated: 2014-09-22
Note:
Journal:
Information Processing Letters, 115(4):515-519, 2015
DOI:
10.1016/j.ipl.2014.11.008
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Abstract
Simon's congruence, denoted \sim_n, relates words having the same subwords of length up to n. We show that, over a k-letter alphabet, the number of words modulo \sim_n is in 2^{Θ(n^{k-1} log n)}.
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